Systems, apparatuses, and methods for testing, analyzing, and assembling RF modules
US12401434B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Dec 19, 2022 |
| Grant date | Aug 26, 2025 |
| Priority date | — |
| Expiry date | Dec 13, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/309
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Systems, apparatuses, and associated methods are provided for testing, analyzing, and assembling radiofrequency (RF) modules. An example system includes a test station for testing an RF module, including testing mechanical, chemical, and/or electrical parameters of the RF module. The testing may involve various sources of error, and the system determines one or more types of error from the test results as well as how to address the error. From completed testing, test results may be utilized in view of expected test results to improve simulations and to determine how two or more RF module may be combined in an RF assembly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.