Patent · US Active

Instrument calibration

US12402957B2 · kind B2 · utility

0Cited by
3References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 2023
Grant dateSep 2, 2025
Priority date
Expiry dateOct 17, 2043

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B2560/0238
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

Surgical instrument calibration methods, systems, and devices are provided that allow a virtual representation of a surgical instrument to be modified to adjust for any variations in a distal tip of a surgical instrument. For example, an instrument calibration system is provided that can have a surgical instrument, a calibration instrument, and a monitoring system. The surgical instrument can have a distal tip and an orientation element thereon, and the calibration instrument can have a pivot point thereon and a calibration reference element attached thereto. The monitoring system can be configured to record movement of the surgical instrument with respect to the calibration instrument when the tip of the surgical instrument is inserted into the pivot point of the calibration instrument, and to calculate a deviation of the tip of the surgical instrument from a predefined ideal tip based on the recorded movement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.