Method and apparatus for detecting defect on surface of cell
US12406349B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2023 |
| Grant date | Sep 2, 2025 |
| Priority date | — |
| Expiry date | Mar 4, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for detecting a defect on a surface of a cell, including: obtaining an initial image of the surface of the cell by using an image acquisition unit; preprocessing the initial image to obtain at least one image to be detected of the surface of the cell; and inputting the at least one image to be detected into a defect detection neural network model, and obtaining a detection result outputted by the defect detection neural network model, the detection result being used to indicate whether there is a defect on the surface of the cell is described. According to technical solutions, features of the defect in the image may be made prominent, so as to facilitate subsequent detection of the defect detection neural network model; and more features may be extracted from the image, thereby improving the efficiency and accuracy of defect detection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.