Patent · US Active

Methods and apparatuses for measuring magnetic flux density and other parameters by means of a plurality of NV centers, and applications thereof

US12411025B2 · kind B2 · utility

0Cited by

0References

6Claims

0Family size

Assignees

QUANTUM TECHNOLOGIES GMBH · US
ELMOS SEMICONDUCTOR SE · DE

Inventors

Bernd Burchard · Dortmund, DE
Jan Meijer · Bochum, DE

Key dates

Filing date	Nov 6, 2020
Grant date	Sep 9, 2025
Priority date	—
Expiry date	Feb 22, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01S15/58
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A sensor system includes a quantum dot including one or more paramagnetic centers. It comprises a control and evaluation device including a pump radiation source, a radiation receiver and which irradiates the quantum dot depending on a transmission signal. The quantum dot emits fluorescence radiation upon irradiation with the pump radiation, which depends on the magnetic flux density and/or on another physical parameter. The control and evaluation device generates an output signal including a measured value as a function of the fluorescence radiation. The control and evaluation device compensatingly readjusts the sensitivity of the quantum dot for the magnetic flux density and/or the other physical parameter by means of one or more compensation coils.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.