Detecting category-specific bias using overfitted machine learning models
US12412124B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2021 |
| Grant date | Sep 9, 2025 |
| Priority date | — |
| Expiry date | Apr 11, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/09
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems are described herein for a mechanism for detecting model bias using a test model to compare predictions for specific categories of data. Thus, the system may detect category-specific model bias and/or present alternative predictions, for example, via overfitted and alternative machine learning models. Another mechanism for detecting model bias is to use residual data from predictions obtained from a machine learning model as the machine learning model processes different datasets (e.g., a training dataset and a compare dataset).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.