Patent · US Active

Detecting category-specific bias using overfitted machine learning models

US12412124B2 · kind B2 · utility

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Key dates

Filing dateDec 1, 2021
Grant dateSep 9, 2025
Priority date
Expiry dateApr 11, 2044

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N3/09
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods and systems are described herein for a mechanism for detecting model bias using a test model to compare predictions for specific categories of data. Thus, the system may detect category-specific model bias and/or present alternative predictions, for example, via overfitted and alternative machine learning models. Another mechanism for detecting model bias is to use residual data from predictions obtained from a machine learning model as the machine learning model processes different datasets (e.g., a training dataset and a compare dataset).

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