Patent · US Active

Native sampler feedback technology

US12412332B2 · kind B2 · utility

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21Claims
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Key dates

Filing dateSep 24, 2021
Grant dateSep 9, 2025
Priority date
Expiry dateDec 15, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T15/005
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods, systems and apparatuses may provide for hardware sampler technology that determines mip region dimensions of a feedback map based on a description of the feedback map, identifies accessed texels in a texture based on a view of a resource that is paired with the feedback map, and records the accessed texels in the feedback map based on the mip region dimensions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.