Problem fix verification generation
US12417140B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2024 |
| Grant date | Sep 16, 2025 |
| Priority date | — |
| Expiry date | Jun 6, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/079
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus for generating problem fix verification procedures for varying corrections to defects are described. An example method includes obtaining problem analysis data associated with a defect of a first computing system. A first representational vector corresponding to the problem analysis data is generated. Second representational vectors corresponding to respective historical defects associated with one or more second computing systems are obtained. A set of historical problem fix verification procedures associated with the defect is determined, based on the first representational vector and at least one of the second representational vectors. A recommended set of problem fix verification procedures for verifying a correct to the defect of the first computing system is provided to a third computing system. The recommended set of problem fix verification procedures include the ranked set of historical problem fix verification procedures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.