Method and device for testing product quality
US12417528B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2020 |
| Grant date | Sep 16, 2025 |
| Priority date | — |
| Expiry date | Apr 20, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and device for testing product quality are disclosed. The method for testing product quality comprises: acquiring an image of a product to be tested; testing the image by using a pre-trained neural network model to obtain a testing result output by the neural network model; when the testing result indicates that the product to be tested is a defective product, performing a secondary judgment on the testing result according to position information of defective feature pixels in the image in the testing result, and determining whether the product to be tested is qualified according to a secondary judgment result. The method has high test accuracy, ensures the quality of product and facilitates reducing the labor cost of test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.