Ophthalmic instrument probe detection method
US12419518B2 · kind B2 · utility
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6References
18Claims
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Key dates
| Filing date | Aug 16, 2023 |
| Grant date | Sep 23, 2025 |
| Priority date | — |
| Expiry date | May 17, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of detecting presence or absence of a magnetic measurement probe at a measurement launch position in an electromagnetic coil of an ophthalmic instrument includes applying a temporary current pulse to the electromagnetic coil, detecting a counter-electromotive force voltage spike induced in the electromagnetic coil by the current pulse, evaluating a decay behavior of the counter-electromotive force voltage spike, and correlating the decay behavior of the counter-electromotive force voltage spike to presence or absence of the measurement probe at the measurement launch position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.