Interference compensated axial magnetometer measurements
US12421842B2 · kind B2 · utility
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2References
6Claims
0Family size
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Key dates
| Filing date | May 8, 2024 |
| Grant date | Sep 23, 2025 |
| Priority date | — |
| Expiry date | May 8, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V11/002
- WIPO fieldCivil engineering
- WIPO sectorOther fields
Abstract
A method for making axial magnetic field measurements in a downhole tool includes evaluating axial magnetic field measurements to determine a magnetic interference offset and removing the magnetic interference offset to obtain compensated axial magnetic field measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.