Patent · US Active

Probe card

US12422457B2 · kind B2 · utility

0Cited by
0References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 19, 2022
Grant dateSep 23, 2025
Priority date
Expiry dateApr 17, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R3/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention provides a probe card. A module cap, on the probe card substrate, is designed to have a chute and the probe module can be installed on or uninstalled from the module cap via the chute. That simplifies the operations of assembling and disassembling the probe card and avoids positioning error.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.