X-ray facility and method for operating an X-ray facility
US12422576B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2023 |
| Grant date | Sep 23, 2025 |
| Priority date | — |
| Expiry date | Mar 27, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/241
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An X-ray imager having an X-ray source, a semiconductor detector, and a processor. On a rear side of the semiconductor detector facing away from the front side, in each of a plurality of imaging regions of the semiconductor detector, at least one imaging electrode is arranged and a plurality of detectors each contact at least one of the imaging electrodes in order to acquire first measurement values relating to X-ray signals of the imaging electrodes. The processor is configured to establish an image dataset dependent upon the first measurement values. At least one additional electrode is arranged on the rear side of the semiconductor detector outside the imaging regions. At least one current sensor contacts the additional electrode or at least one of the additional electrodes in each case to acquire the current flow by way of the second measurement values relating to the at least one additional electrode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.