Oblique plane microscope and method for correcting an aberration in an oblique plane microscope
US12422671B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 9, 2020 |
| Grant date | Sep 23, 2025 |
| Priority date | — |
| Expiry date | Aug 3, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An oblique plane microscope includes an optical imaging system configured to form an image of an object. The optical imaging system includes a telescope system with an optical zoom system, which is adjustable for adapting a magnification of the telescope system to a ratio between two refractive indices, one of which being associated with an object side of the telescope system and the other being associated with an image side of the telescope system. The oblique plane microscope further includes a control unit. The control unit is configured to evaluate an image quality of the image formed by the optical imaging system and to adjust the optical zoom system based on the evaluation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.