Defect discrimination apparatus for printed images and defect discrimination method
US12423802B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2023 |
| Grant date | Sep 23, 2025 |
| Priority date | — |
| Expiry date | Apr 11, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30144
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Prepare a learning model that has been trained to output similarity for each defect species by machine learning using a teacher image that is an image containing a defect occurring during printing and that is associated with a defect species in advance. Then, a target image is prepared for inspection by acquiring an image of printed matter that has been printed. By using the learning model with respect to this target image, the similarity of the defect present in the target image to a known defect species is acquired, and this similarity is used to discriminate the defect present in the target image as at least one of the known defect species. When updating the learning model based on this discrimination result, the learning model is made to perform machine learning for a defect species that is different from the discriminated defect species or that is associated with an unknown defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.