Patent · US Active

Parameter determination apparatus, parameter determination method and recording medium

US12423867B2 · kind B2 · utility

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9Claims
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Key dates

Filing dateNov 1, 2023
Grant dateSep 23, 2025
Priority date
Expiry dateNov 1, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30244
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A parameter determination apparatus (3) includes: a calculation unit (313) that is configured to calculate, based on a recognized result of a plurality of recognition target images by a recognition apparatus (2) that performs a recognition operation on the recognition target image (100, 200), an evaluation value for evaluating the recognized result; and a determination unit (314) that is configured to determine, based on the evaluation value, an image generation parameter (300, 301, 302 303b) that is used to generate the recognition target image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.