Patent · US Active

Intersection testing in a ray tracing system

US12423904B2 · kind B2 · utility

0Cited by
2References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 27, 2023
Grant dateSep 23, 2025
Priority date
Expiry dateMay 11, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2210/21
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and an intersection testing module for performing intersection testing in a ray tracing system determines that a difference between an intersection distance at which a ray intersects a first primitive and an intersection distance at which the ray intersects a second primitive satisfies a comparison condition with respect to a threshold. It is determined that the orientations of the first and second primitives are different. The intersection of the ray with one of the first and second primitives is selected on the basis that the one of the first and second primitives has a particular orientation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.