Patent · US Active

Semiconductor structure including a plurality of semicondcutor pillars and bit line isolation trenches and method for forming same

US12426256B2 · kind B2 · utility

0Cited by
11References
11Claims
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Key dates

Filing dateJul 4, 2022
Grant dateSep 23, 2025
Priority date
Expiry dateNov 7, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/485
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a semiconductor structure includes: providing a semiconductor substrate including a plurality of first semiconductor pillars and bit line isolation trenches arranged at intervals in a first direction; in which the bit line isolation trenches extend in a second direction, the first direction being perpendicular to the second direction; forming a bit line isolation layer in a bit line isolation trench; in which a gap is provided between the bit line isolation layer and the bit line isolation trench, in which the gap is located at a bottom corner of the bit line isolation trench and extends in the second direction, and exposes part of the bottom of the bit line isolation trench; etching a first semiconductor pillar in the first direction through the gap to form a bit line trench; forming a bit line in the bit line trench.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.