Patent · US Active

Method of laser treatment of a semiconductor wafer comprising AlGaInP-LEDs to increase their light generating efficiency

US12426404B2 · kind B2 · utility

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2References
13Claims
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Key dates

Filing dateMay 19, 2020
Grant dateSep 23, 2025
Priority date
Expiry dateJun 22, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/812
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments provide a method for treating a semiconductor wafer comprising a set of aluminum gallium indium phosphide light emitting diodes (AlGaInP-LEDs) to increase a light generating efficiency of the AlGaInP-LEDs, wherein each AlGaInP-LED includes a core active layer for light generation sandwiched between two outer layers, the core active layer having a central light generating area and a peripheral edge surrounding the central light generating area, wherein the method includes treating the peripheral edge of the core active layer of each AlGaInP-LED with a laser beam thereby increasing a minimum band gap in each peripheral edge to such an extent that, during operation of the AlGaInP-LED, an electron-hole recombination is essentially confined to the central light generating area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.