Patent · US Active

System and method for arbitrary optical waveform generation

US12429363B2 · kind B2 · utility

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3References
9Claims
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Key dates

Filing dateApr 21, 2022
Grant dateSep 30, 2025
Priority date
Expiry dateMar 14, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S5/0057
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and a system for arbitrary optical waveform generation from an optical input, the system comprising an optical shaper comprising unbalanced interferometers with at least one delay, the delay being selected of at least 0.1 ps, an optical sampling readout selected for measuring optical waveforms of at least 0.1 ps; and an electronic processing unit; wherein the optical input is a picosecond pulse; with a minimal pulse duration before the optical shaper equal to a minimal delay of the optical shaper; the optical shaper splitting and interfering optical pulses; the optical sampling readout collecting data at an output of the optical shaper; and the electronic processing unit comparing the collected data with a preset target and updating the optical shaper from results of the comparison until a maximal match between the output of the optical shaper and the preset target output, wherein the maximal match is determined iteratively using one of: machine-learning, optimization algorithms and iterative search algorithms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.