Method and system performing pattern clustering
US12430880B2 · kind B2 · utility
0Cited by
8References
19Claims
0Family size
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Key dates
| Filing date | Jan 11, 2023 |
| Grant date | Sep 30, 2025 |
| Priority date | — |
| Expiry date | Jan 26, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/39
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of clustering patterns of an integrated circuit includes; providing a pattern image and numeric data, as input data corresponding to a first pattern to a first model, wherein the first model is trained by a plurality of sample images and a plurality of sample values, obtaining a content latent variable using the first model, and grouping a plurality of content latent variables corresponding to a plurality of patterns into a plurality of clusters based on a Euclidean distance, wherein the numeric data represents at least one attribute of the first pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.