Image sensors with dynamic pixel defect detection and correction
US12432338B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 2024 |
| Grant date | Sep 30, 2025 |
| Priority date | — |
| Expiry date | May 20, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/445
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Defect detection and correction circuitry for image sensors. Example circuitry includes dynamic defect detection circuitry configured to determine an average of a subset of a plurality of pixel output values, the subset excluding maximum and minimum values from among the plurality of pixel output values, determine one or more thresholds based on the average and a difference between a second highest pixel output value and a second lowest pixel output value from among the plurality of pixel output values, and based on an original output value of a pixel-under-correction (PUC) transgressing one of the thresholds, indicate that the PUC has a dynamic defect. The circuitry further includes defect correction circuitry configured to apply a defect correction process based the PUC having either a dynamic defect or a mapped defect, and to produce a corrected output value for the PUC based on the defect correction process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.