Method of and apparatus for measuring the amount of coating material applied to substrates
US3936738A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 2, 1974 |
| Grant date | Feb 3, 1976 |
| Priority date | — |
| Expiry date | Jan 2, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The conductivity and temperature of a coating material before application to a substrate are measured. The overall conductance and the elevated temperature of the coating material after application to the substrate are also measured. A temperature corrected conductivity is then determined from the measured conductivity and the temperature differential between the coating material before and after application to the substrate. Measured overall conductance is then divided by the corrected conductivity to determine the thickness. In addition, the dry weight of the coating may be determined by multiplying the thickness times the density of the coating material times the fractional solids weight.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.