Patent · US Expired

Application of facet-growth to self-aligned Shottky barrier gate field effect transistors

US3943622A · kind A · utility

23Cited by
5References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 22, 1974
Grant dateMar 16, 1976
Priority date
Expiry dateOct 22, 1994

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/944
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device and particularly a self-aligned Schottky barrier gate field-effect transistor is made by epitaxial growth of facets corresponding to the source and drain regions on a surface of a semiconductor body through spaced apart preferably elongated windows in a masking layer and overgrowing edge portions of the masking layer at the windows to form overgrown portions on the facets. The channel region of the transistor is previously formed in the semiconductor body, preferably by epitaxial growth of a layer on a surface of a semiconductor body having a semi-insulating layer adjoining the surface. After removal of the masking layer, the Schottky barrier gate is self-aligned by deposition of metal on the unshielded portions of the planar surface between the facets.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.