Patent · US Expired

Method and device for contactless measuring of the thickness of layers, particularly of insulating layers on metallic parts

US3948082A · kind A · utility

6Cited by
5References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 23, 1974
Grant dateApr 6, 1976
Priority date
Expiry dateDec 23, 1994

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB29C2948/92438
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

A method and device for contactless measuring of the thickness of layers, particularly of insulating layers on metallic parts whereby a contactless pneumatic servo-mechanism approaches to and maintains a measuring head at a predetermined distance from the layer and whereby the thickness of the layer is ascertained by a measuring pick-up located in the measuring head.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.