Patent · US Expired

Method and apparatus for displaying industrial process control parameters

US3952293A · kind A · utility

0Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 1974
Grant dateApr 20, 1976
Priority date
Expiry dateJun 24, 1994

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B1/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A deviation meter, responding to a deviation signal, is mounted on a turntable which rotates in response to a set point adjustment. Rotation of the turntable maintains the null position of the deviation meter pointer at a scale position corresponding to a set point value, so that a direct readout of the actual measurement value is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.