Apparatus for automatically measuring particulate emissions in gas flow
US3965748A · kind A · utility
28Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 18, 1974 |
| Grant date | Jun 29, 1976 |
| Priority date | — |
| Expiry date | Nov 18, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/225
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A stack sampler for collecting particulate samplings in gaseous emissions includes means for automatically matching the volume rate of flow through the sampler to the flow in the stack. Pressure drops and temperatures in the stack and in the sampler are continuously detected and applied to calculating circuitry which controls a valve in the sampler for maintaining isokinetic flow conditions. Filter means removably disposed in the sampler collects particulate material from the gaseous emission during the isokinetic flow which is obtained. Also, flow and flow rate are detected and displayed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.