Device for determining the profile of a surface
US3967114A · kind A · utility
12Cited by
8References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 19, 1974 |
| Grant date | Jun 29, 1976 |
| Priority date | — |
| Expiry date | Dec 19, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C3/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for determining the profile of a surface is disclosed. It comprises a beam arranged in a rotating plane about an axis of rotation, forming on the surface a light spot and scanning a sector of that plane. A detection system whose detection axis is situated in that plane cuts the beam near the surface and a system for measuring the angle formed by the axis of detection and the beam during the scanning when the light spot is situated on the detection axis is utilized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.