Group delay measurement apparatus and method
US3968427A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 11, 1975 |
| Grant date | Jul 6, 1976 |
| Priority date | — |
| Expiry date | Aug 11, 1995 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B3/466
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A network analyzer which compares a reference signal supplied to a device under test with an output signal from the device under test is used to measure the group delay caused by the device under test. The reference signal is produced by a swept frequency signal generator. During the sweep of the signal generator the difference between the instantaneous frequencies of the reference signal and the output signal from the device under test is determined as is the rate of change of the frequency of the reference signal. The instantaneous frequency difference is divided by the rate of change of the reference frequency to produce an instantaneous indication of the group delay produced by the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.