Patent · US Expired

Backside laser dicing system

US3970819A · kind A · utility

85Cited by
8References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 1974
Grant dateJul 20, 1976
Priority date
Expiry dateNov 25, 1994

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T225/12
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A wafer of semiconductor material having a plurality of units defined on its face is subdivided by treating the wafer, on its back or reverse side, in the kerf regions between the units, where division of the units is desired, such that the material of the wafer in the treated kerf regions is converted to a material having a breaking strength lower than the breaking strength of the semiconductor material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.