Determination of semi opaque plasma temperatures
US3972615A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 17, 1975 |
| Grant date | Aug 3, 1976 |
| Priority date | — |
| Expiry date | Jan 17, 1995 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05H1/0006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The temperature of heated gaseous plasmas in non-controllable, non-laboratory applications is measured by an improved spectroscopic analysis. A low atomic number trace gas, such as hydrogen, or helium, is added to the plasma. Temperature is obtained by measuring the ratio of the intensities of two lines of the hydrogen-atom series, e.g. H.sub..alpha. and H.sub..beta. lines of the BALMER SERIES. The technique is applicable in the few electron volt range and the method is applicable even though the plasma is not optically thin and the total number density of the particles in the plasma, at the instant the measurement of temperature is performed, is unknown.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.