Particle detecting system
US3975084A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 19, 1974 |
| Grant date | Aug 17, 1976 |
| Priority date | — |
| Expiry date | Aug 19, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Submicron-sized particles are detected by a system which observes emission, as by scattering or by fluorescence from particles undergoing Brownian motion in a region of a fluid medium excited by an evanescent wave created adjacent an interface between the fluid medium and a multiple internal totally reflecting cell or light guide. The excited region can range in depth between several wavelengths and a fraction of the wavelength of the exciting beam, hence serves as an "aperture" having a dimension of about the same order of magnitude as the particles being detected. The particles can be classified according to size by examining the amplitude modulation arising out of the motion of the particles through the aperture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.