Patent · US Expired

Holographic arrangement for testing materials without destroying same

US3976380A · kind A · utility

9Cited by
2References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 1974
Grant dateAug 24, 1976
Priority date
Expiry dateMar 11, 1994

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B9/021
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for nondestructive testing of articles by holography in which light beams from a virtual point source of laser light and from an observation point are reflected by a reflector toward the same point on the object being checked. The light beams when extended beyond the reflector intersect on an ellipsoid having the point source and the observation point as foci. A plate having a hologram of the article is interposed between the observation point and the reflector and flaws in the object being tested show up on the plate as interference lines when the object is modified in shape by a mass influence such as a temperature change, or a change in pressure thereon, or by vibrations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.