Method and apparatus for detecting defects in a surface regardless of surface finish
US3984189A · kind A · utility
19Cited by
6References
28Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Dec 2, 1974 |
| Grant date | Oct 5, 1976 |
| Priority date | — |
| Expiry date | Dec 2, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8901
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for detecting a flaw, color shading, or the like on the surface of a running object and for producing an electrical signal in response thereto by optically scanning such surface, characterized in that there is provided not only a photoelectric element for receiving the component of light regularly reflected from the surface of the running object, but also means for receiving the component of light irregularly reflected from the surface thereof, thereby to detect all of the defects that may exist on the surface of such object regardless of the surface finish.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.