Temperature monitoring of semiconductors
US4001649A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 30, 1975 |
| Grant date | Jan 4, 1977 |
| Priority date | — |
| Expiry date | Dec 30, 1995 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02H6/00
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A current sensor provides a voltage signal which is proportional to the average current flowing through a semiconductor device junction. This voltage signal is applied to a first analogue circuit which produces an output voltage indicative of the average power dissipated at the junction. The output of the first analogue circuit is applied to a second analogue circuit which outputs a voltage signal indicative of the temperature difference between the junction and a heat sink associated with the semiconductor device and to a third analogue circuit which outputs a voltage signal indicative of the temperature difference between the heat sink and ambient. The ambient temperature is sensed by an ambient temperature sensor which outputs a voltage signal indicative of the ambient temperature. A voltage summing circuit sums the output voltages from the second and third analogue circuits and from the ambient temperature sensor, and produces an output voltage indicative of the junction temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.