Patent · US Expired

Wedge action electrical test probe

US4001679A · kind A · utility

6Cited by

3References

7Claims

0Family size

Inventors

William P. Cargile · Rue de l'Église, US
W. Andrew Morrison · Saratoga, US

Key dates

Filing date	Feb 19, 1975
Grant date	Jan 4, 1977
Priority date	—
Expiry date	Feb 19, 1995

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06788
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test probe for effecting temporary electrical connection to circuit terminals of miniature integrated circuits or like elements with small inter-terminal spacings. The probe has an insulative tip having a cross-sectional dimension smaller than the space between adjacent terminals. In an axially extending groove in the tip is a stiff wire, and a mechanism is provided for controllably moving the wire out of the groove after the tip has been inserted between two terminals. When the wire moves out of the groove, it contacts one of the electric terminals and wedges the insulative tip against the adjacent terminal so as to retain the probe in place.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.