Patent · US Expired

Apparatus for testing molten metal

US4003260A · kind A · utility

10Cited by

7References

5Claims

0Family size

Assignee

Centre De Recherches Metallurgiques-Centrum Voor Research in De Metallurgie · BE

Inventor

Philippe Felix Catoul · Grâce-Hollogne, BE

Key dates

Filing date	Nov 25, 1974
Grant date	Jan 18, 1977
Priority date	—
Expiry date	Nov 25, 1994

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S73/09
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring or sampling probe is to be lowered to a desired depth in a molten metal. The probe is mounted on a probe carrier which can be lowered and raised. A contact detector, which emits a control signal when the detector comes into contact with the upper surface of the molten metal, is fixed on the probe carrier at a distance above the probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.