Thin film magnetometer using an orthogonal flux gate
US4007417A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 1974 |
| Grant date | Feb 8, 1977 |
| Priority date | — |
| Expiry date | Jun 14, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/05
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The orthogonal flux gate thin film magnetometer comprising an orthogonal flux gate utilizing a rotation magnetization mechanism consisting of a sensing coil wound on a plated wire formed by applying to a conductor a ferromagnetic thin film, an alternating excitation power means for exciting the thin film of the flux gate, an amplitude difference detection circuit means for detecting a difference between positive and negative asymmetrical peak values of the output voltage of the flux gate, and a control means for feedback of the output of the detection circuit to the sensing coil of the flux gate through a feedback circuit and for supplying the output of the control means to an indicating means. The magnitude and the polarity of the external magnetic field are sensed from the feedback current which erases the external magnetic field applied to the flux gate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.