Patent · US Expired

Method for non-destructive removal of semiconductor devices

US4012832A · kind A · utility

39Cited by
4References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 12, 1976
Grant dateMar 22, 1977
Priority date
Expiry dateMar 12, 1996

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19107
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Semiconductor devices having a conductive lead pattern on the bottom of the device are bonded to conductive pads on a substrate to form an electrical connection therewith. The connection comprises two layers of conductive adhesive plastic separated by a small chip of conductive alloy which melts above the curing temperature of the adhesive plastic. The non-destructive removal of a semiconductor device from the substrate is accomplished by heating only the semiconductor device to be removed until the alloy chip under the device melts, thus, permitting the non-destructive removal of the semiconductor device without the application of force which would tend to destroy the semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.