X-ray spectral decomposition imaging system
US4029963A · kind A · utility
173Cited by
1References
22Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 30, 1976 |
| Grant date | Jun 14, 1977 |
| Priority date | — |
| Expiry date | Jul 30, 1996 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S378/901
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Projection measurements are made of the transmitted x-ray beam in low and high energy regions. These are combined in a non-linear processor to produce atomic-number-dependent and density-dependent projection information. This information is used to provide cross-sectional images which are free of spectral-shift artifacts and completely define the specific material properties.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.