Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
US4034220A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 1975 |
| Grant date | Jul 5, 1977 |
| Priority date | — |
| Expiry date | Dec 16, 1995 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J37/256
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process of elementary and chemical analysis of samples by spectrum analysis of secondary electrons emitted by the sample when it is subjected to a beam of monoenergetic primary electrons concentrated on its surface is characterized in that the intensity of a beam of monoenergetic primary electrons E.sub.p emitted by an electron gun is modulated according to a sinusoidal law at a frequency .omega., in that the secondary electrons of energy E emitted by the sample are collected, in that the intensity of the collected beam is detected by generating an electric detection signal proportional to the intensity, in that the intensity of the component of the frequency .omega. of the detection signal which provides the number of secondary electrons corresponding to the said energy is measured, and, in that the value of the collection energy E is modified in order to scan the energy spectrum comprised between the values E.sub.1 and E.sub.2 so that one obtains the spectrum n(E) of the intensity of the secondary electron emission of the sample as a function of the energy E.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.