Dual beam X-ray thickness gauge
US4037104A · kind A · utility
19Cited by
3References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 29, 1976 |
| Grant date | Jul 19, 1977 |
| Priority date | — |
| Expiry date | Apr 29, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and method for continuous measurement of thickness of a sheet at a rolling mill or the like without contacting the sheet. A system directing radiation through the sheet in two energy bands and providing a measure of change in composition of the material as it passes the thickness gauging station. A system providing for changing the absorption coefficient of the material in the thickness measurement as a function of the change in composition so that the measured thickness is substantially independent of variations in composition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.