Method and apparatus for simultaneous optical measurement of particle characteristics
US4038556A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 1976 |
| Grant date | Jul 26, 1977 |
| Priority date | — |
| Expiry date | Jun 14, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1477
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for simultaneous optical measurement of several characteristics of each particle of a group of small particles while the particles are suspended in a liquid. The apparatus includes a sample passage structure through which the particles pass, and a first optical detector structure which receives light from the sample passage structure. The sample passage structure and detector are aligned one with respect to the other. The output of a source of light is directed to the sample passage structure by an alignment device which aligns the light and the sample passage structure. A second optical detector receives the light passed by the sample passage structure. The second detector includes a converging lens and a photodetector so positioned with respect to one another that the light pattern at the detector due to the passage of a particle through the sample passage structure will maintain a substantially constant intensity notwithstanding movement of the sample passage structure, particle or the light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.