Device for non-destructive measurement of a surface layer of a material
US4038865A · kind A · utility
6Cited by
2References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 3, 1971 |
| Grant date | Aug 2, 1977 |
| Priority date | — |
| Expiry date | Jun 3, 1991 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B17/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention relates to a device for non-destructive measurement of the extent to which a surface layer of a material has been affected by a superficial treatment. The device has an emitter of ultrasonic waves and a receiver therefor, the emitter and receiver being movable over the arcuate surface of a semi-cylindrical block which is applied to the material being studied. The emitter and receiver can be moved until the ultrasonic beam is reflected by the surface of the material and measured, means being provided for precise measurement of the angle formed between the emitter and receiver.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.