Apparatus for testing electronic devices having a high density array of pin leads
US4045735A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 1976 |
| Grant date | Aug 30, 1977 |
| Priority date | — |
| Expiry date | Feb 17, 1996 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S439/912
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for testing electronic devices having a high density array of pin leads includes a zero insertion force socket having coaxial output leads with the inner conductor being a conductor pair with the coaxial lead terminating at a number of test heads. Each test head includes switching means for terminating the output coaxial lead in a characteristic impedance. The various test heads are then coaxially coupled, maintaining the two conductor inner lead pair, to more distant signal sources and receivers of both the ac and dc types to provide for Kelvin testing by separately connecting the inner conductor pair to power and sense devices or shorting the conductor pair together and conducting ac testing by use of pulsers and discriminators, or other dynamic test sources or sense devices such as sinewave devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.