Self-compensating X-ray or .gamma.-ray thickness gauge
US4047029A · kind A · utility
56Cited by
2References
16Claims
0Family size
Inventor
Key dates
| Filing date | Jul 2, 1976 |
| Grant date | Sep 6, 1977 |
| Priority date | — |
| Expiry date | Jul 2, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gauge for determining the mass per unit area, or alternatively the thickness of sheet material by measuring the attenuation, as well as backscatter, of an X-ray beam or the like, while continuously taking into account deviations and changes in localized material composition, insofar as these have an effect on the transmission coefficient of the beam. Electrical signals representing these deviations are combined with calibration data for given material nominal properties, i.e., nominal composition. The resultant and output signal represents the mass per unit area or thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.