Selectable wavelength X-ray source, spectrometer and assay method
US4048496A · kind A · utility
Inventor
Key dates
| Filing date | Nov 20, 1975 |
| Grant date | Sep 13, 1977 |
| Priority date | — |
| Expiry date | Nov 20, 1995 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/116
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for producing X-rays having any selected one of a plurality of specific different wavelength spectra greatly facilitates X-ray fluorescence analysis of samples to detect constituent elements. In the X-ray source, an electron beam is directed to any selectable one of an array of primary targets of different composition. X-rays from the selected primary target may be utilized directly or caused to impinge on any selected one of a plurality of secondary targets, which are also each of differing composition to cause the secondary target to emit a specific X-ray spectrum characteristic of that secondary target. Analysis of the X-ray fluorescence from a sample irradiated by a plurality of different specific selected X-ray spectra enables identification and measurement of particular chemical elements in the sample. The system including the selection of appropriate combinations of primary and secondary targets may be uncontrolled manually or by a computer responsive to the detector of the X-ray fluorescence from the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.