Specular reflectance microdensitometer
US4054391A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 18, 1975 |
| Grant date | Oct 18, 1977 |
| Priority date | — |
| Expiry date | Dec 18, 1995 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A specular reflectance microdensitometer including an illuminating microscope and a collecting microscope, disposed on optical axes at equal and opposite angles relative to a reflecting test surface. The illuminating microscope illuminates a known area on the test surface from which light is reflected into the collecting microscope. The objective lens of the collecting microscope images the illuminated test surface on a field lens which in turn images the objective lens on the face of a fiber optic bundle. The light incident on the fiber bundle is transmitted to a photomultiplier tube for quantitative determination of light level. The amount of light specularly reflected by the test surface is correlated to the density of particle coverage on the surface, and plotted on an X-Y record.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.