Automatic electronic test equipment and method
US4055801A · kind A · utility
Inventors
Key dates
| Filing date | Aug 18, 1970 |
| Grant date | Oct 25, 1977 |
| Priority date | — |
| Expiry date | Aug 18, 1990 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31917
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for the automatic testing of electronic equipment in which a general purpose digital computer is programmed for the equipment to be tested to generate appropriate stimulus waveforms for application to the equipment to be tested and for the measurement and evaluation of the waveforms responsively generated by the equipment tested. The computer directly controls the point-by-point generation of the analog stimulus waveforms by a plurality of analog to digital and analog to synchro converters, the application of the stimulus waveforms to selected leads of the unit to be tested, and the application of the response waveforms to a selected measurement circuit for conversion to digital form for subsequent evaluation by the computer against programmed standards.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.