Patent · US Expired

Semiconductor memory structures

US4057788A · kind A · utility

39Cited by
3References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 6, 1975
Grant dateNov 8, 1977
Priority date
Expiry dateOct 6, 1995

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/0466
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of storing electric charges in a metal-nitride-oxide-semiconductor memory element by setting the threshold voltage of the element at any of a substantial number of voltages by applying both a DC voltage corresponding to the analog voltage to be stored and an AC voltage which is gradually reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.