Patent · US Expired

Apparatus and method for generating timing signals for latched type memories

US4060794A · kind A · utility

25Cited by
2References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1976
Grant dateNov 29, 1977
Priority date
Expiry dateMar 31, 1996

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/408
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Apparatus and a method for generating timing signals to be utilized in latched type memories only when the address signals are valid. A CAS signal is generated in response to an RAS signal via a device which tracks the worst case delay of memory address signals and does not permit the application of the CAS signal to memory until the worst case delay of the memory address signals has been accounted for. A memory array is comprised of any combination of latched or non-latched tri-state memories. The latched memories are coupled to a data bus utilizing conventional TTL circuits in combination with a power driver to simulate conventional tri-state buffer circuits. When the power driver/drivers remove(s) power from TTL circuits, the tri-state characteristics are simulated; whereas when the power driver applies power to the TTL circuits, they operate in their normal mode and present a normal impedance between the data bus and data-out lines of the memory array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.